ellipsometry

名词 n.
中文释义

英文释义

名词 n.
  1. An optical technique for investigating the dielectric properties of thin films, especially those used in fabricating semiconductors uncountable

词源

Etymology tree
English ellipse
Ancient Greek -ο- (-o-)der.
Latin -o-bor.
English -o-
Proto-Indo-European *meh₁-
Proto-Indo-European *-tḗr
Proto-Indo-European *-trom
Proto-Hellenic *-tron
Ancient Greek -τρον (-tron)
Ancient Greek μέτρον (métron)
Proto-Indo-European *-h₂
Proto-Indo-European *-éh₂
Proto-Indo-European *-i-eh₂
Proto-Hellenic *-íā
Ancient Greek -ῐ́ᾱ (-ĭ́ā)
Ancient Greek -μετρία (-metría)der.
Latin -metriader.
Old French -métrieder.
English -metry
English ellipsometry
From ellipse + -o- + -metry.
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